Improvement of the measurement site environment and effective use of measurement information.
TEC-SSS-130
Range : 50(25) mm. , Resolution : 0.01 mm. , Depth : 45 mm. , Contact Point : φ10 Flat , Anvil Form : φ10 Flat
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TEC-SSS-5650
Range : 12 mm. , Resolution : 0.001 mm. , Depth : 30 mm. , Contact Point : φ10 Flat , Anvil Form : φ10 Flat
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TEC-SSS-550-3A
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 120 mm. , Contact Point : φ5 Flat , Anvil Form : φ5 Flat
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TEC-SSS-550-LW
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 120 mm. , Contact Point : φ3.2 Ball , Anvil Form : φ3.2 Ball
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TEC-SSS-550-LS
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 120 mm. , Contact Point : φ3.2 Ball , Anvil Form : φ10 Flat
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TEC-SSS-550
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 120 mm. , Contact Point : φ10 Flat , Anvil Form : φ10 Flat
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TEC-SSS-540-3A
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 30 mm. , Contact Point : φ5 Flat , Anvil Form : φ5 Flat
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TEC-SSS-540-LW
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 30 mm. , Contact Point : φ3.2 Ball , Anvil Form : φ3.2 Ball
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TEC-SSS-540-LS
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 30 mm. , Contact Point : φ3.2 Ball , Anvil Form : φ10 Flat
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TEC-SSS-540
Range : 12 mm. , Resolution : 0.01 mm. , Depth : 30 mm. , Contact Point : φ10 Flat , Anvil Form : φ10 Flat
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